secondary-electron yield

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• secondary-electron yield — antrinės elektronų emisijos išeiga statusas T sritis radioelektronika atitikmenys: angl. secondary electron yield vok. Sekundärelektronenausbeute, f rus. коэффициент вторичной эмиссии электронов, m pranc. coefficient d émission secondaire, m;… …   Radioelektronikos terminų žodynas

• Electron cloud — Nuage d électrons Un nuage d électrons (en anglais, electron cloud ou e cloud) est un groupe d électrons qui voyagent dans un accélérateur de particules après avoir été arrachés à des gaz résiduels contenus dans l accélérateur et aux parois de l… …   Wikipédia en Français

• Secondary emission — is a phenomenon where additional electrons, called secondary electrons, are emitted from the surface of a material when an incident particle (often, charged particle such as electron or ion) impacts the material with sufficient energy. The number …   Wikipedia

• Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… …   Wikipedia

• electron tube — an electronic device that consists, typically, of a sealed glass bulb containing two or more electrodes: used to generate, amplify, and rectify electric oscillations and alternating currents. Also called electronic tube. Cf. gas tube, vacuum tube …   Universalium

• Electron microprobe — An electron microprobe (EMP), also known as an electron probe microanalyser (EPMA) is an analytical tool used to non destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron… …   Wikipedia

• Electron-Cloud Effect — The Electron Cloud Effect (ECE) is a phenomenon associated with particle accelerators. Explanation Electron clouds are created when accelerated charged particles disturb stray electrons already floating in the tube, and bounce or slingshot the… …   Wikipedia

• Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …   Wikipedia

• Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• Field electron emission — It is requested that a diagram or diagrams be included in this article to improve its quality. For more information, refer to discussion on this page and/or the listing at Wikipedia:Requested images. Field emission (FE) (also known as field… …   Wikipedia